Showing results: 166 - 180 of 250 items found.
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ScanExpress Runner Gang -
Corelis, Inc.
Electronic manufacturing test systems must be fast and efficient. Schedules today are shorter, products are more complex, and the market demands higher speed—the product needs to be built and shipped yesterday.ScanExpress Runner Gang Edition is a concurrent boundary-scan and in-system programming test executive designed specifically for high volume production. Unlike traditional test systems which execute sequentially on a single unit under test (UUT) at a time, ScanExpress Runner Gang Edition provides concurrent (gang) testing on up to 8 UUTs for improved test and programming times.
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6565 SERIES -
Wayne Kerr Electronics, Ltd.
The 6565 HF DC Bias Unit is intended to be used with a Wayne Kerr 6500 analyzer, either the 6500B Precision Impedance Analyzer or the 6500P HF LCR Meter. Its function is to provide a source of DC bias current through the Device Under Test (DUT) while the analyzer is making AC measurements. Each 6565 unit can provide up to 10 A of DC current, and up to six 6565 units can be connected in parallel to supply a maximum 60 A. A digital ammeter on the front panel allows the user to see the dc bias current value and an indicator LED shows when the bias current is enabled.
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NX5300 -
Terotest Systems Ltd.
The NX5300 is a single slot 3U PXI device and interfaces to the unit under test via an On-Chip Debug (OCD) or JTAG port. The NX5300 is a high performance JTAG based background debug mode (BDM) diagnostic system designed for functional test, development, programming and troubleshooting of microprocessor and microcontroller based embedded processor systems.
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Acery Technologies
The RF / MW switch includes a variety of RF and microwave switch modules - RF multiplexers, which are available for use in the 34980A multifunction switch / measurement unit, providing broadband switching from DC to 20GHz . Use these modules to route test signals between your device under test and a signal source, oscilloscope, spectrum analyzer, or other instrument. The switch / attenuator driver module also controls the external switches and attenuators of the 34980A.
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ProfLine Series -
Teseq AG
The Teseq ProfLine system is a complete and cost effective Harmonics and Flicker measurement test system which compiles to the latest IEC/EN standards, including IEC 61000-3-2 and IEC 61000-3-3. The programmable power generation capability of up to 45 kVA (90 kVA and 145 kVA sources comprise multiple 45 kVA units) provides more than ample power to cater for a wide range of Equipment Under Test (EUT).
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34904A -
Keysight Technologies
The Keysight 34904A module for the 34970A/34972A Data Acquisition/Switch Unit gives you the most flexible connection path between your device under test and your test equipment, allowing different instruments to be connected to multiple points on your DUT at the same time. Rows or columns may be connected between multiple modules to build 8 x 8, 4 x 16 or larger matrices, with up to 96 crosspoints in a single frame.
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PS48402 -
APPLICOS
The PS48402 is a dual-channel Programmable DC Power supply in a single-slot 3u PXI / cPCI form factor. Each output is fully isolated and capable of providing 0 - 48V DC / 2 A / 80 W per channel. Both current and voltage are programmable and readable with 16-bit resolution. This makes the PS48402 a very cost- and rackspace-effective solution to power your dual-rail unit under test.
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Vacuum Interrupters, Inc.
Introducing the CBT-1201 circuit breaker timer, a self-contained, multi-use test set designed to operate and interact with all types of circuit breakers. Incorporating a digital timer to capture and store trip, close and bounce times, it is a handy, field portable unit that also incorporates a power supply for charging spring charged breakers while outside their cubicle, switching to trip and close the breaker, and has unique cable sets which speed and simplify connection to the breaker under test.
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M+P International
Shock testing simulates an extreme event that a unit under test is exposed to during handling, shipment, explosive event and/or daily use (e.g. dropping an object). The profile for this type of testing is defined by the shape of the time domain waveform together with its amplitude and duration. The m+p VibControl vibration control system offers full functionality for classical shock and shock response spectrum testing as well as for tests using external pulses or the capture of transient signals.
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Bloomy Controls, Inc.
The BMS Environmental Test System is a configurable platform simulating the essential signals used by Battery Management Systems (BMS) and cell-monitoring modules with the ability to perform environmental testing on multiple BMS units simultaneously. The system implements single-point value testing to evaluate specific BMS functions such as cell over and under voltage scenarios, cell leakage current, lost communications, or faulty system IO.
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Atico Export
This machine is designed to test laminated springs and coil springs. The test is held under laminated springs and coil springs. The Cabinet comprises of the hydraulic unit, the hand wheel of the pump and the release valve handles are outside the cabinet for easy operation. This compact base carrier two fixed upright and four horizontal plates. The first and the third plates with two small uprights from an adjustable frame. The second and the fourth plates are fixed. A square threaded wheel arrangements provided for adjusting the height of the springs.
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AWG22 -
APPLICOS
The AWG22 is a 22 bit Arbitrary Waveform Generator for medium-speed / high resolution waveform generation. The module combines an exceptional dynamic performance with a very high DC accuracy.The AWG22 is upwards compatible with the AWG20 and also features differential outputs with a programmable common-mode voltage.The module has 8 output ranges starting at 80mVpp up to 10.20Vpp, which covers a wide range of Unit Under Test input voltages.
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SMSU -
SW Link Ltd
SMSU Series SourceMeterSwitch Unit (SMSU), introduced by SW Link Ltd, is single-channel voltage/current sourcing, 4X6 switch matrix and measurement instruments. Each Series 100 SMSU instrument tightly integrates highly accurate stable DC power source and a true instrument-grade programmable gain amplifier and 18bits ADC on a 100x100mm PCBs. It can output up to 20V, sub-uA to 1A current to device under test (DUT)
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778572-15 -
NI
35-Channel, 0.25 A PXI Signal Insertion Switch Module—The PXI‑2515 is a multiplexer switch module that enables connectivity by routing high-speed digital I/O (DIO) signals between a device under test (DUT) and an NI high-speed DIO device or a parametric measurement device. You can use modules such as PXI Source Measure Units (SMUs) and PXI Digital Multimeters (DMMs) with high-speed digital devices. With the PXI‑2515, you can perform parametric tests on digital pins without external connectivity or impedance mismatch challenges.
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780587-15 -
NI
PXIe, 35-Channel, 0.25 A PXI Signal Insertion Switch Module—The PXIe‑2515 is a multiplexer switch module that enables connectivity by routing high-speed digital I/O (DIO) signals between a device under test (DUT) and an NI high-speed DIO device or a parametric measurement device. You can use modules such as PXI Source Measure Units (SMUs) and PXI Digital Multimeters (DMMs) with high-speed digital devices. With the PXIe‑2515, you can perform parametric tests on digital pins without external connectivity or impedance mismatch challenges.
